Publications

CHASSEIGNE R., DUBARD J., PIERRARD S., HAY B., ” Light pollution analysis using hi-resolution night aerial lighting maps”, Proceedings of the 29th Quadriennal Session of CIE, CIE x046:2019, PO163, DOI: 10.25039/x46.2019.PO163

DUBARD J., OBEIN G., SURYANI D., “Bilateral comparison of luminous flux using lamps as transfer standards (EURAMET.PR-K4.2)”, Metrologia, 56, 2019, 1A, Tech. Suppl., 02001, DOI: 10.1088/0026-1394/56/1A/02001

GED G., OBEIN G., RABAL A. M., « Du brillant à la BRDF », in Simonot L. et Boulenguez P., Quand la matière diffuse la lumière, Presses des Mines, 2019, 209-220.

GED G., « Goniospectrophotométrie à haute résolution angulaire », in Simonot L. et Boulenguez P., Quand la matière diffuse la lumière, Presses des Mines, 2019, 129-145.

OBEIN G., « Le goniospectrophotomètre : principe, performances et limitations », in Simonot L. et Boulenguez P., Quand la matière diffuse la lumière, Presses des Mines, 2019, 71-90.

OBEIN G., “Traceability and references for the measurement of appearance: review of latest developments at Europeans national metrological institutes”, Proceedings of COMET 2019, Cergy, France.

OBEIN G., “Measurement of appearance; optical, visual and normative approach”, Proceedings of “Procédés laser pour l’industrie conference”, 25-26 Sept, Colmar, France.

RABAL A. M., GED G., OBEIN G., “What is the true width and height of the specular peak according to the level of gloss?”, Proceedings of the 29th Quadriennal Session of CIE, CIE x046:2019, OP88, DOI 10.25039/x46.2019.OP88

SALIS E., PAVANELLO D., KROEGER I., WINTER S., BOTHE K., HINKEN D., GANDY T., HOHL-EBINGER J., FRIESEN G., DITTMANN S., DUBARD J., MÜLLEJANS H., “Results of four European round-robins on TCO measurements for PV devices of different size”, Solar Energy, 179, February 2019, 424-436, DOI: 10.1016/j.solener.2018.10.051

SIMONOT L., OBEIN G., BRINGIER B., MENEVEAUX D., “Modeling, measuring, and using BRDF : significant French contributions”, Journal of the Optical Society of America A, 36,11, C40-C50, DOI: 10.1364/JOSAA.36.000C40

SIMONOT L., CHAVEL P., HEBERT M., OBEIN G., « Peut-on mesurer la BRDF? », Quand la matière diffuse la lumière, par Simonot L. et Boulenguez P., Presses des Mines, 2019, 439-452.

Communications

OBEIN G., “Traceability and references for the measurement of appearance: review of latest developments at Europeans national metrological institutes”, Proceedings of 3rd Congress of Cosmetic Measurement & Testing (COMET), Cergy, France, 6-7 février 2019.

GED G., “Characterization of gloss, Workshop on Visual Appearance of Materials, Alicante, Spain, 29th May 2019.

RABAL A., “What is the true width and height of the specular peak according to the level of gloss?”, Workshop on Visual Appearance of Materials, Alicante, Spain, 29th May 2019.

RABAL A. M., GED G., OBEIN G., “What is the true width and height of the specular peak according to the level of gloss?”, 29th Quadriennal Session of CIE, Washington DC, USA, 14-22 juin 2019.

CHASSEIGNE R., DUBARD J., PIERRARD S., HAY B., ” Light pollution analysis using hi-resolution night aerial lighting maps”, 29th Quadriennal Session of CIE, Washington DC, USA, 14-22 juin 2019.

OBEIN G., “The candela, the most human of the SI base units”, International School of Physics "Enrico Fermi", Varenna, Italie, 6 Juillet 2019.

OBEIN G., “The measurement of appearance”, International School of Physics "Enrico Fermi”, Varenna, Italie, 7 Juillet 2019.

OBEIN G., “Measurement of appearance; optical, visual and normative approach”, conference “Procédés laser pour l’industrie”, 25-26 Septembre, Colmar, France.

DUBARD J., “New photovoltaic technologies: metrology for PV Energy rating”, Congrès International de métrologie, Paris, France, 24-26 septembre 2019.

CHASSEIGNE R., DUBARD J., PIERRARD S., HAY B., “Improved method for high-resolution night aerial lighting maps production and analysis”, Congrès International de métrologie, Paris, France, 24-26 septembre 2019.

OBEIN G., “Traceability & references for the measurement of appearance” (keynote), Material appearance workshop, Colour Imaging Conference, Paris, France, 21 Oct 2019.