Publications
BASTARDO-FERNÁNDEZ I., CHEKRI R., NOIREAUX J., GIVELET L., LAMBENG N., DELVALLÉE A., LOESCHNER K., FISICARO P. and JITARU P., "Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by single particle inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system", Food Additives & Contaminants: Part A, 2024, 41, 8, 867‑884, DOI: 10.1080/19440049.2024.2359532.
CROUZIER L., FELTIN N. and JABLON B., "A new metrology tool: using transmission Kikuchi diffraction (TKD) to identify and separate nanoparticles for regulatory purposes", Measurement Science and Technology, 2025, 36, 1, 015038, DOI: 10.1088/1361-6501/ad93ee.
FELTIN N., DELVALLÉE A. and CROUZIER L., "Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM", Nanomaterials, 2024, 14, 11, 931, DOI: 10.3390/nano14110931.
ENNIAFA M., KAFTANDJIAN V., OBATON A-F., and BRZUCHACZ S., "Configuration of the surface determination parameters for dimensional measurements with/using helpful metric as visualisation tool", e-Journal of Nondestructive Testing, 2024, 29, 3, DOI: 10.58286/29281.
GUILLORY J., BASELGA S., WALLERAND J-P., TRUONG D., GARCÍA-ASENJO L., LUJÁN R., PESCE D., WEYER B., FUCHS J-F. and MISSIAEN D., "Comparison between a Two-Wavelength Absolute Distance Meter and a GNSS-Based Distance Meter at CERN Geodetic Network", Journal of Surveying Engineering, 2025, 151, 1, 04024014, DOI: 10.1061/JSUED2.SUENG-1523.
GUILLORY J., TRUONG D., WALLERAND J-P. and ALEXANDRE C., "A sub-millimetre two-wavelength EDM that compensates the air refractive index: uncertainty and measurements up to 5 km", Measurement Science and Technology, 2024, 35, 2, 025024, DOI: 10.1088/1361-6501/ad0a22.
OBATON A-F., "About Osseointegration Evaluation Criteria", Orthopedics and Rheumatology Open Access Journal, 2024, 23, 1, DOI: 10.19080/OROAJ.2024.23.556104.
OBATON A-F., FAIN J., MEINEL D., TSAMOS A., LÉONARD F., LÉCUELLE B., DJEMAÏ M. and BRUNO G., "Investigation of a New Ti Alloy for a New Generation of Additively Manufactured Implants with Lattice", Contemporary Perspective on Science, Technology and Research Vol. 7, B P International, 2024. p. 12‑37. ISBN 978-81-971391-8-5.
OBATON A-F., FALLAHI N., TANICH A., LAFON L-F. and WEAVER G., "Statistical Analysis and Automation Through Machine Learning of Resonant Ultrasound Spectroscopy Data from Tests Performed on Complex Additively Manufactured Parts", Journal of Nondestructive Evaluation, 2024, 43, 1, 21, DOI: 10.1007/s10921-023-01035-8.
OBATON A-F., TANICH A., FISCHER N., ANTONA S., MONTAGNER F., GENOT S., BRZUCHACZ S., SOETE PD., DUBOEUF K., BEUVIER T., NANJAREDDY R., COUTANT N., COCHENNEC N. and GAY L., "Accuracy of XCT to Perform Dimensional Measurements on Different Measurands", Science and Technology: Developments and Applications Vol. 1, BP International, 2024. p. 22‑61. ISBN 978-93-48859-70-9.
OMPALA C., RENAULT J-P., TACHÉ O., COURNÈDE É., DEVINEAU S. and CHIVAS-JOLY C., "Stability and dispersibility of microplastics in experimental exposure medium and their dimensional characterization by SMLS, SAXS, Raman microscopy, and SEM", Journal of Hazardous Materials, 2024, 469, 134083, DOI: 10.1016/j.jhazmat.2024.134083.
RIBOTTA L., DELVALLÉE A., CARA E., BELLOTTI R., GIURA A., CARLO ID., FRETTO M., KNULST W., KOOPS R., TORRE B., SAGHI Z. et BOARINO L., "AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires", Measurement Science and Technology, 2024, 35, 10, 105014, DOI: 10.1088/1361-6501/ad5e9f.
SENTIS M.P.L., FELTIN N., LAMBENG N., LEMAHIEU G., BRAMBILLA G., MEUNIER G. and CHIVAS-JOLY C., "Investigation of nanoparticle dispersibility and stability based on TiO2 analysis by SMLS, DLS, and SEM", Journal of Nanoparticle Research, 2024, 26, 3, 55, DOI: 10.1007/s11051-024-05959-8.
XU J., REFINO AD., DELVALLÉE A., SEIBERT S., SCHWALB C., HANSEN PE., FOLDYNA M., SIAUDINYTE L., HAMDANA G., WASISTO HS., KOTTMEIER J., DIETZEL A., WEIMANN T., PRÜSSING JK., BRACHT H. and PEINER E., "Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures", Applied Physics Reviews, 2024, 11, 2, 021411, DOI: 10.1063/5.0166284.
Communications
OBATON A-F., FERRUCCI M., GIERA B., HARRIS A. and HASLAM J., "Benefit of X-ray imaging to improve additive manufacturing", Electronic imaging 2024, San Francisco (Etats-Unis), 21 January 2024.
ENNIAFA M., KAFTANDJIAN-DOUDET V., OBATON A-F. and BRZUCHACZ S., "XCT parametric study on the influence of acquisition setup and tweaking of surface determination on the dimensional measurement with helpful metric as visualization tool", ICT2024, Wels (Autriche), 6 February 2024.
GUILLORY J., "Multilateration-based coordinate measurement system", NPL workshop “Celebrating Science”, Teddington (Royaume-Uni), 28 February 2024.
CHIBANE L., DELVALLÉE A., FLEURENCE N., MORAN J., FLAHAUT E. and FELTIN N., "Correlative imaging of single graphene oxide flake: sample selection and limitations", E-MRS Spring Meeting 2024 – Symposium L: ALTECH 2024, Graz (Autriche), 27 May 2024.
CHIBANE L., DELVALLÉE A., FLEURENCE N., MORAN J., FLAHAUT E. and FELTIN N., "Correlative imaging of single graphene oxide flake: sample selection and limitations", Summer School ELENAM, Fréjus (France), 3 June 2024.
OBATON A-F., "Image quality and standardization", 9th CIA‐CT Conference, Lyngby (Danemark), 4 June 2024.
OBATON A-F., "High-performance non-destructive techniques for quality assurance of complex-geometry additively manufactured parts", AM conference, Berlin (Allemagne), 12 June 2024.
RIBOTTA L. and DELVALLÉE A., "Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM", NanoInnovation Rome, Rome (Italie), 9 September 2024.
ALASONATI E., CHIVAS-JOLY C., FELTIN N., LALÈRE B., ALTMANN K., WIESNER Y. and GIOVANNOZZI AM., "From Qualitative to Quantitative Measurement of Small Microplastics Using Multi-Detector Field Flow Fractionation Coupled Offline to Microscopy and Raman Spectroscopy", Conférence internationale MICRO 2024, Lanzarote (Espagne), 23 septembre 2024.
CHIVAS-JOLY C., OMPALA C., RENAULT J-P., TACHE O., COURNED E. and DEVINEAU S., "Stability and dispersibility of microplastics in experimental exposure medium and detection of nanoplastic fractions by SMLS, SAXS, Raman microscopy, and SEM", Conférence internationale MICRO 2024, Lanzarote (Espagne), 23 septembre 2024.
SARGEANT B., ROBSON S., RICHARDS C., PUERTO P., GARCIA BERDOTE A., LEIZEA I., GUILLORY J., TRUONG D., WALLERAND J-P., GOUTTEFARDE M., HERVÉ P-E., HEISSELMANN D., POLLINGER F., RAFELD E., FRANKE M. and GEVA K., "Photogrammetry in the DynaMITE Project", 3D Metrology Conference, Loughborough (Royaume-Uni), 24 September 2024.
GUILLORY J., TRUONG D., WALLERAND J-P., SARGEANT B., RICHARDS C., ROBSON S., GARCIA BERDOTE A., PUERTO P., HERVÉ P-E. and GOUTTEFARDE M., "Positioning a cable-driven parallel robot at better than 0.25 mm using a multilateration system assisted by photogrammetry", 3D Metrology Conference, Loughborough (Royaume-Uni), 24 September 2024.
DELALANDE Y., DUCOURTIEUX S., DURAND S., GUILLORY J., LESTRADE A., SEBDAOUI M., LELUAN B. and BOURGOIN C., "Modelling and optimisation of SOLEIL II survey and uncertainty assessment of the measurement process using Monte Carlo approach", International Workshop on Accelerator Alignment, Californie (Etats-Unis), 7 October 2024.
GUILLORY J., WALLERAND J-P., TRUONG D., BASELGA S., GARCÍA-ASENJO L., LUJÁN R., WEZKA K., PRÓCHNIEWICZ D., WISNIEWSKI M., WEYER B., FUCHS J-F. and MISSIAEN D., "Sub-millimetric field measurements over kilometres using Arpent two-wavelength ADM", International Workshop on Accelerator Alignment, Californie (Etats-Unis), 7 October 2024.
CHIBANE L., DELVALLÉE A., FLEURENCE N., MORAN J., FLAHAUT E. and FELTIN N., "Métrologie corrélative pour l’étude des propriétés physico-chimiques de l’oxyde de graphène au cours de sa réduction", Journée des doctorants de l’ED Toulouse, Toulouse (France), November 2024.
SILVESTRI Z., "Planned comparisons on the MQB-Pascal project", MQB-Pascal Workshop 2024, Berlin (Allemagne), 27 November 2024.
OBATON A-F., "X-ray computed tomography (XCT) and resonant ultrasound spectroscopy (RUS) techniques for quality inspection of additively manufactured parts", WSE3DPAM, Prague (République Tchèque), 2 December 2024.
GUILLORY J., "Télémétrie laser et applications en robotique et en géodésie", Photonics Excellence Day 2024, Orsay (France), 5 December 2024.