Publications
AGAZAR M., ISTRATE D. and PRADAYROL P. “Evaluation of the accuracy and frequency response of medium-voltage instrument transformers under the combined influence factors of temperature and vibration”, Energies, 2023, 16, 13, 5012, DOI: 10.3390/en16135012.
BERGEAL N., VELLUIRE PELLAT Z., MARECHAL E., MOULONGUET N., SAIZ G. and COUEDO F., “Hybrid quantum systems with high-T c superconducting resonators”, Scientific Reports, 2023, 13, 1, 14366, DOI: 10.1038/s41598-023-41472-z.
CUI X., YUAN W., ALLAL D. and ZIADÉ F., “Key comparison CCEM.RF-K27.W of RF power from 50 GHz to 75 GHz in rectangular waveguide”, Metrologia, 2023, 60, 1A, Techn. Suppl., 01001, DOI: 10.1088/0026-1394/60/1A/01001.
IMANALIEV A., THEVENOT O., DOUGDAD K. and PIQUEMAL F., “Measuring non-linearity in AH 2700A capacitance bridges with sub-ppm level uncertainty”, IEEE Transactions on Instrumentation and Measurement, 2023, 72, 1503006, DOI: 10.1109/TIM.2023.3293144.
KAJA K., ASSOUM A., DE WOLF P., PIQUEMAL F. and NEHMEE A., “3D Imaging and quantitative subsurface dielectric constant measurement using peak force Kelvin probe force microscopy”, Advanced Materials Interfaces, 2023, 2300503, DOI: 10.1002/admi.202300503, Open Access - online: 9 Nov. 2023.
KHAN M.S., AGAZAR M. and LE BIHAN Y., “Design, simulation, and fabrication of a 500 kV ultrawideband coaxial matched load and its connectors for fast transient pulse measurement systems”, MDPI, 2023, 17, 1, 166, 10.3390/en17010166.
LETIZIA P.S., CROTTI G., MINGOTTI A., AGAZAR M. and ISTRATE D., “Characterization of instrument transformers under realistic conditions: impact of single and combined influence quantities on their wideband behavior”, 2023, Sensors, 2023, 23, 18, 7833, DOI: 10.3390/s23187833.
PIQUEMAL F., KAJA K., CHRETIEN P., MORAN-MEZA J., HOUZE F., ULYSSE C. and HAROURI A., “A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements”, Beilstein Journal of Nanotechnology, 2023, 14, 1141-1148, DOI: 10.3762/bjnano.14.94.
STOKES D., GELLERSEN F., ALLAL D. and KUHLMANN F., “Traceable S-parameter measurements up to 90 GHz in 1.35 mm Coaxial”, Measurement Science and Technology, 2023, 34, 6, 064006, DOI: 10.1088/1361-6501/acc04c.
THEVENOT O., IMANALIEV A. DOUGDAG K. and PIQUEMAL F., “Progress report on the Thompson-Lampard Calculable Capacitor at LNE”, IEEE Transactions on Instrumentation and Measurement, 2023, 72, 1502306, DOI: 10.1109/TIM.2023.3282666.
TURHAN E., ERKAN O., HAYIRLI C. and ISTRATE D., “EURAMET.EM-S44 comparison for ultra-low DC current sources”, Metrologia, 2023, 60, 1A, Techn. suppl., 01002, DOI: 10.1088/0026-1394/60/1A/01002.
Communications
ALLAL D., « Métrologie pour la standardisation de technologies sans fil émergentes », 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
BECHER F., ZIADÉ F. and LE BIHAN Y., “Toward the de sign of a sensor for measuring average power in the Terahertz frequency band [110 - 170 GHz]”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
DJORDJEVIC S., « Générateur quantique de courant programmable : nouveaux développements », 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
DJORDJEVIC S. and POIRIER W., “Progress report on the development of programmable quantum current generator (PQCG)”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
IMANALIEV A., THÉVENOT O., DOUGDAG K. and PIQUEMAL F., “Characterization and applications of the new LNE Thompson Lampard calculable capacitor”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
KUCERA J., IMANALIEV A. and THÉVENOT O., “On alternative DAC linearity testing traceable to lenght unit”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
LI Z., KUHLMANN C., XU J., PEINER E., KAJA K., PIQUEMAL F. and BRAND U., “Nanoelectrical characterisation of vertical nanowires used for energy harvesting”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
MORAN‐MEZA J., KAJA K., RICHERT D., PENUELAS J., REGRENY P., GOGNEAU N. and PIQUEMAL F., “Towards calibrated measurements of dopant concentrations on vertical nanowires by scanning microwave microscopy”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
PIQUEMAL F., « Aperçu du projet EMPIR Elena », 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
PIQUEMAL F., HOFFMANN J., KAJA K., GAUTIER B., HERTWIG A. and FABRICIUS N., “ELENA : a European project for electrical nanoscale metrology in industry”, 21th International Metrology Congress (CIM), Lyon, France, 7-10 mars 2023.
PIQUEMAL F., HOFFMANN J., KAJA K., GAUTIER B. and HERTWIG A., “ELENA: a European project for electrical nanoscale metrology in industry”, 2023 Nanoscience Meeting (C'nano 2023), Palais des Congrès du Futuroscope, Poitiers, France, 15-17 mars 2023.
KAJA K. and PIQUEMAL F., « Cartographie quantitative de la constante diélectrique des nanostructures enterrées en microscopie de force à sonde Kelvin », 24e Forum des microscopies à sonde locale, Obernai, France, 3-7 avril 2023.
PIQUEMAL F., HOFFMANN J., KAJA K., GAUTIER B. and HERTWIG A., “ELENA : a European project for electrical nanoscale metrology in industry”, 24e Forum des microscopies à sonde locale, Obernai, France, 3-7 avril 2023.
RICHERT D., KAJA K., MORAN J., GAUTIER B., DELERUYELLE D. and PIQUEMAL F., « Evaluation de la robustesse de la méthode d’étalonnage Short Open Load appliquée à la mesure de capacité par Scanning Microwave Microscopy », 24e Forum des microscopies à sonde locale, Obernai, France, 3-7 avril 2023.
MEISNER J., GERDINAND F., PASSON S., GOCKENBACH E., SCHORN H., SAADEDDINE H., AGAZAR M., HÄLLSTRÖM J., HAVUNEN J., SCHICHLER U., ELG A-P., ROVIRA J., ROCCATO P-E., CARIA S-E., MEREV A., DEDEOGLU S., LAHTI K., DOWBYSCH A., ORREA A., STEINER T. and GAMLIN M., “Combined and composite high-voltage wave shapes calibration and standardisation”, Highvolt Kolloquium ’23, Dresde, Allemagne, 4-5 May 2023.
ALLAL D., LAHBACHA K. and DI CAPUA G., “Signal integrity analysis of coupled thin-film microstrip lines (TFMSLs)”, IEEE 27th Workshop on Signal and Power Integrity (SPI), Aveiro, Portugal, 7-10 May 2023, DOI: 10.1109/SPI57109.2023.10145525.
PHUNG G.N., ARZ U., ALLAL D. and PHAM T.D., “Recommendations for the design of differential thin-film microstrip lines”, IEEE 27th Workshop on Signal and Power Integrity (SPI), Aveiro, Portugal, 7-10 May 2023, DOI: 10.1109/SPI57109.2023.10145555.
LI Z., KUHLMANN C., KAJA K., PIQUEMAL F., HILLER K., HAHN S. and BRAND U., “Development of a conductive MEMS-SPM for nanoelectrical characterisation of nanostructured materials”, SMSI 2023 Conference – Sensor and Measurement Science International, Nuremberg, Germany, 8-11 May 2023.
IMANALIEV A., THEVENOT O., DOUGDAG K. and PIQUEMAL F., “Characterization and applications of LNE’s Thompson Lampard calculable capacitor (TLCC)”, 2023 EURAMET LF expert meeting, CMI, Brno, République Tchèque, 25 mai 2023.
IMANALIEV A., THEVENOT O., DOUGDAG K. and PIQUEMAL F., “Non-linearity of AH2700A Capacitance Bridges at the 0.1 ppm level”, 2023 EURAMET LF expert meeting, CMI, Brno, Czech Republic, 25 mai 2023.
PIQUEMAL F., “Some news from ELENA: 2 selected results”, 2023 EURAMET LF expert meeting, CMI, Brno, République Tchèque, 25 mai 2023.
TAUPIN M. and COUËDO F., “Quantum Hall resistance standard measurements in a cryogen-free system”, 2023 EURAMET LF expert meeting, CMI, Brno, République Tchèque, 25 mai 2023.
MOKHTARI C., SECK D., ALLAL A., BERTHE M. and HADDADI K., “Nanorobotics and automatic on-wafer probe station with nanometer positionning accuracy”, 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Winnipeg, MB, Canada, 28-30 June 2023, DOI: 10.1109/NEMO56117.2023.10202165.
RICHERT D., DELERUYELLE D., MORÁN-MEZA J.A., KAJA K., GAUTIER B., and PIQUEMAL F., “A fully-numerical environment for evaluating the robustness of the short open load calibration for capacitance measurements in Scanning Microwave Microscopy”, 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO'2023), Winnipeg, MB, Canada, 28-30 June 2023, DOI: 10.1109/NEMO56117.2023.10202380.
THERET A., COUEDO F., TAUPIN M., MICHON A., MASTROPASQUA C., MAILLY D. and SCHOPFER F., “Molecular doping of Graphene: Towards a low-field quantum Hall standard”, Congrès général des 150 ans de la Société Française de Physique - Mini-colloque Dernières avancées dans le domaine des technologies quantiques, Paris, France, 2-7 juillet 2023.
TREYER P., HAMMER U., SAADEDDINE H., HAVUNEN J., HÄLLSTRÖM J., PASSON S. and MEISNER J., “Importance of impulse calibrator output impedance and method of all waveform compensation”, 23rd International Symposium on High Voltage Engineering (ISH 2023), Glasgow, United-Kingdom, 28 August-1er Sept. 2023.
LI Z., KAJA K., PIQUEMAL F., HILLER K., HAHN S., HÜSNÜ A., “A Conductive MEMS-SPM using exchangeable AFM probes as indenters for nanoelectromechanical measurement of nanomaterials”, EUROSENSORS 2023, Lecce, Italy, 10-13 September 2023.
SHANG X., RIDLER N., ARZ U., PHUNG G.N., ROCH-JEUNE I., DUCOURNAU G., HADDADI K., FLISGEN T., DOERNER R., ALLAL D., JAYASANKAR D., STAKE J., SCHMIDT R., FISHER G. and MUBARAK F., “Interlaboratory investigation of on-wafer S-parameter measurements from 110 GHz to 1.1 THz”, 53rd European Microwave Conference, Berlin, Allemagne, 19-21 September 2023.
LOH T.H., EMRAH T., PYTHOUD F., ALLAL D. and ALOMAINY A., “Recent activities of a european union joint research project on metrology for emerging wireless standards”, Antenna Measurement Techniques Association Symposium (AMTA), Renton, WA, USA. IEEE, 8-13 October 2023, ISBN 9798350335668, DOI: 10.23919/AMTA58553.2023.10293283.
PIQUEMAL F., KAJA K., CHRETIEN P., MORAN‐MEZA J., HOUZE F., ULYSSE C. and HAROURI A., “Calibrating resistance measurements in conductive probe atomic force microscopy: Development of the first universal standard sample”, Nanoscale 2023, Helsinki, Finland, 10-12 October 2023.
RICHERT D., KAJA K., MORÁN J.A., GAUTIER B., DELERUYELLE D. and PIQUEMAL F., “A numerical environment for evaluating the robustness of the short open load calibration for capacitance measurements in scanning microwave microscopy”, Nanoscale 2023, Helsinki, Finland, 10-12 October 2023.
POIRIER W., « Les unités électriques à l’ère quantique », Académie des Technologies / Journées thématiques « Le système international d’unités (SI) version 2018 - Quels impacts et quelles perspectives ? », Paris, France, conf. invitée le 25 oct. 2023.
MORAN‐MEZA J., KAJA K., PENUELAS J., REGRENY P. and PIQUEMAL F., “Calibrated measurements of dopant concentrations on vertical nanowires by scanning microwave microscopy”, Journées nationales du photovoltaïque (JNPV 2023), Club Belambra, Dourdan, France, 5-8 décembre 2023.