Publications
AGAZAR M. and SAADEDDINE H., “Accurate Technique for the Calibration of High-Voltage Capacitance and Dissipation Factor Bridges up to 1 kHz”, Metrology, 2024, 4, 4, 578-597, DOI: 10.3390/metrology4040036.
AGAZAR M., D’AVANZO G., FRIGO G., RIETVELD G. and VAN DEN BROM H., “Power Grids and Instrument Transformers up to 150 kHz: A Review of Literature and Standards”, Sensors, 2024, 24, 4148, DOI: 10.3390/s24134148.
ALLAL D., SHANG X., NAFTALY M. and SKINNER J., “Interlaboratory comparison of dielectric measurements from microwave to terahertz frequencies using vna-based and optical-based methods”, IEEE Transactions on Microwave Theory and Techniques, 2024, 72, 11, 6473-6493, DOI: 10.1109/TMTT.2024.3399879.
CELEP M., STOKES D., DANACI E., ZIADE F., KAZEMIPOUR A. and ALLAL D., “Interlaboratory comparison of power measurements at millimetre- and sub-millimetre-wave frequencies”, Metrology, 2024, 4, 2, 279–294, DOI: 10.3390/metrology4020017.
HOFFMANN J., RICHERT D., MORAN-MEZA J. and PIQUEMAL F., “Comparison of impedance matching networks for scanning microwave”, IEEE Transactions on Instrumentation and Measurement, 2024, 73, 6006109, doi: 10.1109/TIM.2024.3378310.
IMANALIEV A., THEVENOT O. and DOUGDAG K., “Finite element analysis of the uncertainty contribution from mechanical imperfections in the LNE’s Thompson–Lampard calculable capacitor”, IEEE Transactions on Instrumentation and Measurement, 2024, 73, 1503309, DOI: 10.1109/TIM.2024.3470031.
ISTRATE D., OUAMEUR M., SOCCALINGAME S. et PHILOMINRAJ A., « Mesures d’intensité de courant électrique », Techniques de l'ingénieur, 2024, R1015v3, DOI: 10.51257/a-v3-r1015.
KAJA K., ASSOUM A., DE WOLF P., PIQUEMAL F. and NEHMEE A., “3D-imaging and quantitative subsurface dielectric constant measurement using peak force Kelvin probe force microscopy”, Advanced Materials Interfaces, 2024, 11, 2, 2300503, DOI: 10.1002/admi.202300503.
KHAN M.S., AGAZAR M. and LE BIHAN Y., “Design, simulation, and fabrication of a 500 kV ultrawideband coaxial matched load and its connectors for fast transient pulse measurement systems”, Energies, 2024, 17, 1, https://doi.org/10.3390/en17010166.
LAHBACHA K., DI CAPUA G., MIELE G., PHAM T.D., MAFFUCCI A., CHIARIELLO A.G. and ALLAL D., “Measurement-based signal integrity analysis of coupled thin-film microstrip lines”, IEEE International Symposium on Measurements & Networking (M&N), 2024, 73, 10615657, DOI: 10.1109/MN60932.2024.10615657.
LAHBACHA K., PHUNG G.N., PHAM T.D., MIELE G., ARZ U., DI CAPUA G. and ALLAL D., “Guidelines for the design of thin film microstrip lines for signal integrity analysis”, IEEE Transactions on Components, Packaging and Manufacturing Technology, 2024, 14, 11, 2032-2042, DOI: 10.1109/TCPMT.2024.3473533.
OUAMEUR M., ISTRATE D. and ZIADE F., “Wideband current transducer traceable calibration up to 10 A and 1MHz”, Sensors, 2024, 24, 8, 2608, DOI: 10.3390/s24082608.
OUAMEUR M., VASCONCELLOS R. and AGAZAR M., “Digital impedance bridge for four terminal-pair ac resistor calibration up to 20 kHz”, Metrology, 2024, 4, 1, DOI: 10.3390/metrology4010001.
SHANG X., RIDLER N.M., STOKES D. and ZIADE F., “Some recent advances in measurements at millimeter-wave and terahertz frequencies: Advances in high frequency measurements”, IEEE Microwave Magazine, 2024, 25, 1, 58-71, DOI: 10.1109/MMM.2023.3321516.
Communications
PIQUEMAL F., CHRETIEN P., MORAN-MEZA J., HOUZE F., ULYSSE C. and HAROURI A., « Développement de premières structures de référence pour l'étalonnage des mesures de résistance et de courant en microscopie à force atomique à sonde conductrice », 25e Forum des microscopies à sonde locale, Lyon, France, 22-26 April 2024.
RICHERT D., MORAN-MEZA J., DELVALLEE A., GAUTIER B. and PIQUEMAL F., « Comparaison de l’étalonnage du Scanning Microwave Microscopy par deux échantillons de référence capacitive », 25e Forum des microscopies à sonde locale, Lyon, France, 22-26 April 2024.
ERMILOVA E., WEISE M., HERTWIG A., DE PREVILLE S., HOFFMANN J., MORÁN-MEZA J. and PIQUEMAL F., “Ellispometry as optical metrology method for analysis of reference materials for nanoelectronic”, Symposium on Analtytical techniques for accurate nanoscale characterisation of advanced materials / European Materials Research Society (ALTECH2024-EMRS), Strasbourg, France, 27-31 May 2024.
MORÁN‐MEZA J., PIQUEMAL F., CHRÉTIEN P., HOUZÉ F., ULYSSE C. and HAROURI A., “Development of first universal standard samples for calibrating Resistance and current measurements in Conductive probe Atomic Force Microscopy”, Symposium on Analtytical techniques for accurate nanoscale characterisation of advanced materials / European Materials Research Society (ALTECH2024-EMRS), Strasbourg, France, 27-31 May 2024.
CHIBANE L., DELVALLÉE A., FLEURENCE N., MORAN J., FLAHAUT E. and FELTIN N., “Correlative metrology to study physicochemical roperties of graphene oxide during the reduction process”, Summer school ELENAM: Metrology at the nanoscale, Villa Cynthia, Frejus, France, 3-7 June 2024.
GOMÈS S. and PIQUEMAL F., “Analytical and hybrid techniques”, Summer school ELENAM: Metrology at the nanoscale, Villa Cynthia, Frejus, France, 3-7 June 2024.
PIQUEMAL F. and RICHERT D., “Calibrating measurements in conductive probe atomic force microscopy and scanning microwave microscopy”, Summer school ELENAM: Metrology at the nanoscale, Villa Cynthia, Frejus, France, 3-7 June 2024.
ALLAL D., « Conception de kits TRL à l'échelle nano pour les mesures de paramètres S sur tranche en configuration masse-signal-masse », 23es Journées Nationales Microondes (JNM), Antibes Juan-Les-Pins, France, 4-7 June 2024.
BECHER F., ZIADE F., BA D. and LE BIHAN Y., « Développement d’une sonde de puissance thermoélectrique pour la bande de fréquence [110 - 170 GHz] en comparant deux substrats diélectriques différents », 23es Journées Nationales Microondes (JNM), Antibes Juan-Les-Pins, France, 4-7 June 2024.
DAABOUL Y., BERTIN L., YANG X., LE BIHAN Y. and ISTRATE D., “DC power quality analysis: technical insights for LVDC networks and measurement systems”, CIRED, Vienna, Austria, 19-20 June 2024, paper 217.
LAHBACHA K., DI CAPUA G., MIELE G., PHAM T.D., MAFFUCCI A., CHIARIELLO A.G. and ALLAL D., “Measurement-based signal integrity analysis of coupled thin-film microstrip lines”, IEEE 29th Workshop on Signal and Power Integrity (SPI), Rome (Italy), 2-5 juillet 2024, Proceedings: DOI: 10.1109/mn60932.2024.10615657.
ALLAL D., SAYEGH A. and RAUSCHE F., “S-parameter bilateral comparison in 4.3-10 coaxial line”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10645995.
CROTTI G., LETIZIA P.S., AGAZAR M., ISTRATE D. and VAN DEN BROM H., “Characterization of MV instrument transformers for power quality measurement: the contribution from the IT4PQ project”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10645830.
DJORDJEVIC S., BEHR R. and POIRIER W., « Next generation Programmable Quantum Current Generator », 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646087.
ELG A., SAADEDDINE H. et al., “High-Voltage Metrology for Electric Energy and Supply Reliability”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646152.
GIORDANO D., QUINTANA FERNANDEZ J., GALLO D., HALLSTROM J., ISTRATE D., JORDACHE M., MARISCOTTI A., RIETVELD G., ROVIRA J., VENUGOPAL P . and ZHAO W., “Metrology support for enhanced energy efficiency in DC transportation systems”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646053.
IMANALIEV A., THEVENOT O. and DOUGDAG K., “Finite Element Analysis of Mechanical Imperfections in the LNE Thompson-Lampard Calculable Capacitor Standard”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646138.
IMANALIEV A., THEVENOT O. and MGHALFI M., “Automated coaxial IVD impedance bridge for the low value capacitance measurements at audio frequencies”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646031.
PHAM T.D., PHUNG G.N., LAHBACHA K., MAFFUCCI A., MIELE G., ARZ U. and ALLAL D., “Measurement and analysis of on-wafer test structures for signal integrity assessment at chip level”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646002.
ZUCCA M., AL-ZUBAIDI-R-SMITH N., BARTOVA L., VAN DEN BROM H., CALLEGARO L., CULTRERA A., FAST L., GRANDINETTI B., HASSANZADEH M., MARISCOTTI A., MASOURAS A., MUSUMECI S., NICOL G., OUAMEUR M. and RIETVELD G., “The project metrology for static and dynamic characterization of supercapacitors – MetSuperCap”, 2024 Conference on Precision Electromagnetic Measurements (CPEM-2024), Denver (CO), USA, 8-12 July 2024, Proceedings: DOI: 10.1109/cpem61406.2024.10646148.
SECK D., ALLAL D., and HADDADI K., “On-wafer TRL calibration design for microwave nanoscale and high impedance measurement”, 2024 IEEE Symposium on Wireless Technology & Applications (ISWTA), Kuala Lumpur, Malaysia, 20-21 July 2024, Proceedings in DOI: 10.1109/iswta62130.2024.10651788.
ZUCCA M.,…, OUAMEUR M. et al., “MetSuperCap: metrology for static and dynamic characterisation of supercapacitors”, XXIV IMEKO World Congress, Hamburg, Germany, 26-29 August 2024, Proceedings in Measurement: Sensors, 2024, 38, Suppl., 101434, DOI: 10.1016/j.measen.2024.101434.
TREYER P., HAMMER U., SAADEDDINE H., HAVUNEN J., HÄLLSTRÖM J.K., PASSON S. and MEISNER J., “Importance of impulse calibrator output impedance and method of all-waveform compensation”, 23rd International Symposium on High Voltage Engineering (ISH 2023), Glasgow, UK, 28 August - 1st Sept. 2023, IET Conference Proceedings released in 2024: DOI: 10.1049/icp.2024.0577.