Publications
Ansari-Asl M., Barbieri M., Obein G., Hardeberg J., 2023, “Advancing Material Appearance Measurement: A Cost-effective Multispectral Imaging System for Capturing SVBRDF and BTF”, London Imaging Meeting 2023, Society for Imaging Science and Technology, Jun 2023, London, United Kingdom, pp 104-108. DOI : 10.3390/jimaging10030055.
Basic N., Molloy E., Koo A., Ferrero A., Santafé P., Gevaux L., Porrovecchio G., Schirmacher A., Smid M., Blattner P.,Hauer K., Quast T., Campos J, Obein G., 2023, “Intercomparison of bidirectional reflectance distribution function (BRDF) measurements at in- and out-of-plane geometries”, Applied Optics. DOI : 10.1364/AO.486156.
García-Márquez J., Valencia-Estrada J. C., Freeform concentrator design for IR wireless to-fiber link communications, Journal of the Optical Society of America A 40, 1741 (2023). DOI : 10.1364/JOSAA.495621.
Gevaux L., Saha D., and Obein G., 2023, "Investigating the optical translucency of Spectralon using BSSRDF measurements," Appl. Opt. 62, 5003-5013. DOI : 10.1364/AO.491929.
Gozhyk I., Turbil C., Garcia E., Obein G., 2023, “Impact of light polarization on angle-resolved light scattering from gloss scale”, Physica Scripta 98(9). DOI : 10.1088/1402-4896/ace99b.
Khlevnoy B. B., Solodilov M. V., Kolesnikova S. S., Otryaskin D.A., Pons A., Campos J., Shin D. J., Park S., Obein G., Valin M. H., Vissière A., Dai C., Wu Z., Wang Y., Li L., Lin Y., Yoon H., Gibson C., Liu Y., Manson P., Atkinson E., Zama T., Shitomi H., Goodman T., Servantes W., Gamouras A., Woods D. J., Sperfeld P. and Pape S. “CIPM key comparison CCPR-K1.a.2017 for spectral irradiance 250 nm to 2500 nm. Final report” Metrologia, Volume 60, Number 1A. DOI : 10.1088/0026-1394/60/1A/02002.
Lafitte A., Sordello R., Legrand M., Nicolas V., Obein G., Reyjol Y., 2023, “Does a flashing artificial light have more or conversely less impacts on animals than a continuous one? A systematic review”, Nature Conservation, 54, pp 149-177. DOI : 10.3897/natureconservation.54.102614.
Molloy E., Koo A., Gevaux L., Obein G., Yang L., 2023, “Use of bidirectional transmittance distribution function measurements to determine transmittance haze”, Metrologia 60 055003. DOI : 10.1088/1681-7575/ace910
Communications
Dubard J., Betis P., Garcia-Marquez J. « Metrology for emerging PV applications », CIM 2023, Lyon, March 7-10 2023.
Eloi F., Dubard J., « Revision and extension of standards for test methods for LED lamps, luminaires and modules”, CIM 2023, Lyon, March 7-10 2023.
Gevaux L., Dupiau A., Morvan K., Obein G., 2023, “The measurement of specular gloss using a conoscopic goniospectrophotometer”, London Imaging Meeting 2023, Society for Imaging Science and Technology, Jun 2023, London, United Kingdom. pp.10-14.
Obein G., 2023, “Physics and Measurement of properties linked to appearance”, London Imaging Meeting 2023, Society for Imaging Science and Technology, Jun 2023, London, United Kingdom pp1-4.
Ferrero A., Gevaux L., Rastgou M., Jaanimets M., Jurgo I., Manoocheri F., Kubarsepp T., Nilsson A., Szaina G., Obein G., 2023, “Preliminary study for traceability on specular gloss”, CIE Conference 2023, 30th Session, September 2023, Ljubjiana, Slovenia.
Gevaux L., Morvan K., Dupiau A., Saha D., Frisvad J. R., Obein G., 2023, “Method for traceability of multiscale bidirectional reflectance distribution function measurements”, CIE Conference 2023, 30th Session, September 2023, Ljubjiana, Slovenia.
Saez, A.M., Ferrero, A., Ledig, J., Schrader, C., Gevaux L., Dupiau, A., Maltezos, E., Antonopoulos, M., Rezazadeh, Y., Bouroussis, C., 2023, “Framework for evaluation of procedures for HDR luminance imaging measurements”, CIE Conference 2023, 30th Session, September 2023, Ljubjiana, Slovenia.
Chasseigne R., Renoux R., Pierrard S., Betis P., Garcia-Marquez J., Dubard J., Hay B.,
Airborne luminancemeter for obtrusive light measurements. Proceedings of the 30th Session of the CIE, pp. 1888-1892 (September 15th, 2023).
Obein G., “De Nouvelles métriques pour la LED ? », Journée LED 2050: évolutions, révolutions…, Paris, 3 octobre 2023.
Gevaux L., Saha D., Morvan K., Obein G., 2023, “µBRDF measurements & traceability challenges”, CORM – CNC/CIE – CIE-USNC Biennial Joint Conference 2023, 6 Novembre 2023, en ligne.
Dupiau A., Gevaux L., Saez, A.M., Ferrero, A., 2023 “High dynamic range merging algorithms for traceable luminance imaging”, IS&T/APPAMAT Workshop on material appearance, 13 Novembre 2023, Paris.
Gevaux L., Simonot L., Clerc R., Hébert M., 2023 “Edge-loss effect in skin reflectance measurements”, IS&T/APPAMAT Workshop on material appearance, 13 Novembre 2023, Paris.