Liste des références des publications et communications du RNMF parues en 2019 dans le domaine « Longueur et grandeurs dimensionnelles »

Publications

BOUZAKHER N., CHIVAS-JOLY C., DEVOILLE L., HOCHEPIED J. –F., FELTIN N. “Challenges in sample preparation for measuring nanoparticles size by scanning electron microscopy from suspensions”, powder form and complex media, Powder Technology, 359, online 9 October 2019, 226-237, DOI: 10.1016/j.powtec.2019.10.022

CHIVAS-JOLY C., LONGUET C., POURCHEZ J., LECLERC L., SARRY G., J-M. LOPEZ-CUESTA J-M. “Physical, morphological and chemical modification of Al-based nanofillers in by-products of incinerated nanocomposites and related biological outcome”, Journal of Hazardous Materials, 365, 5 March 2019, 405-412, DOI: 10.1016/j.jhazmat.2018.10.029

CROUZIER L., DELVALLEE A., ALLARD A., DEVOILLE L., DUCOURTIEUX S., FELTIN N. “Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM”, Measurement Science and Technology, 30, 28 June 2019, 8, 085004, DOI: 10.1088/1361-6501/ab1495

CROUZIER L., DELVALLEE A., DUCOURTIEUX S., DEVOILLE L., NOIRCLER G., ULYSSE C., TACHE O., BARRUET E., TROMAS C., FELTIN N. “Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology”, Beilstein Journal of Nanotechnology, 10, 28 july 2019, 1523–1536,DOI: 10.3762/bjnano.10.150

CROUZIER L., DELVALLEE A., DUCOURTIEUX S., DEVOILLE L., TROMAS C., FELTIN N. “A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point”, Ultramicroscopy, 207, December 2019, 112847, DOI: 10.1016/j.ultramic.2019.112847

FELTIN N., DUCOURTIEUX S., L. CROUZIER L., DELVALLEE A., DIRSCHEL K., ZENG G., “Scanning probe microscopy (SPM), “Characterization of Nanoparticles - measurement processes for nanoparticles”, ELSEVIER, 24 September 2019, ISBN: 9780128141823

GUILLORY J., TEYSSENDIER DE LA SERVE M., TRUONG D., ALEXANDRE C. WALLERAND J-P., “Uncertainty Assessment of Optical Distance Measurements at Micrometer Level Accuracy for Long-Range Applications”, IEEE Transactions on Instrumentation and Measurement, 68, June 2019, 6, 2260-2267, DOI:10.1109/TIM.2019.2902804

TOGUEM S-C.T., VISSIÈRE,A., DAMAK M., MEHDI-SOUZANI C., ANWER N., NOUIRA H. “Design of an ultra-high precision machine for form measurement” Procedia CIRP, 84, September 2019, 942-947, DOI:10.1016/j.procir.2019.04.262

VIPREY F., NOUIRA H., LAVERNHE S., TOURNIER C. “Modelling and characterisation of geometric errors on 5-axis machine-tool”, edp Sciences - Mechanics & Industry, 20, 5 September 2019, 6, 605, DOI:10.1051/meca/2019034

Communications

DUCOURTIEUX S., “Development of new validation measurements at LNE under Graphene Flagship – Core 2 – Structural characterization of graphene-based materials“ Réunion Graphene Flagship Validation Service, LNE Paris, France, 11 Mars 2019

FLEURENCE N., DELVALLEE A., SCHOPFER F., « Présentation des résultats de mesures par MPTR sur les échantillons GrapheneXT (graphene oxyde deposited on Si wafer) et d’une cartographie en conductivité thermique par SThM d’un flocon de graphène fourni par le VAMAS », Réunion Graphene Flagship Validation Service, Paris, France, 11 mars 2019.

 AREZKI Y., LEPRETRE F., PSOTA P., SU R., HEIKKINEN V., ZHANG X., CAI N., BITOU Y., LEACH R., LÉDL V., ANWER N., MEHDI-SOUZANI C., NOUIRA H. “Material standards design for minimum zone fitting of freeform optics”, EUSPEN 2019, Conference Proceedings - 19th International Conference and Exhibition, Bilbao, Espagne, 3-7 June 2019

TOGUEM S.-C.T., MEHDI-SOUZANI C., ANWER N., NOUIRA H. “Customized design of artefacts for additive manufacturing”, EUSPEN 2019, Conference Proceedings - 19th International Conference and Exhibition, Bilbao Espagne, 3-7 June 2019

OBATON A.-F., BUTSCH B., CARCREFF E., LAROCHE N., TARR J., DONMEZ A., “Efficient volumetric non-destructive testing methods for additively manufactured parts”, the ICWAM, Metz, France, 5-7 June 2019

DUCOURTIEUX S., DELVALLEE A., CERIA P., ULYSSE C., « L’AFM métrologique français : une nouvelle voie de traçabilité pour les mesures dimensionnelles à l’échelle nanométrique », 8ème Rencontres annuelles en nanométrologie, Paris, France, 17 Juin 2019

KIM F., PINTAR A., FOX J., TARR J., DONMEZ A., OBATON A.-F., “Probability of detection of x-ray computed tomography of additive manufacturing defects”, the QNDE Conference, Portland, OR, USA, 14-18 July 2019

OBATON A.-F., “Overview of the EMPIR project: Metrology for additively manufactured medical implants”, Euspen, Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing, Ecole Centrale de Nantes, France, 16-18 September 2019

MIMOUNE K.: “Evaluation and improvement of localization algorithms based on UWB Pozyx system”, The 27th International Conference on Software, Telecommunications and Computer Networks - SoftCOM 2019 - General Conference, Split, Croatie, 19-21 September 2019

DELVALLÉE A., SCHOPFER F., FLEURENCE N., DELVALLÉE A., DUCOURTIEUX S., MORÁN J., PIQUEMAL F., FELTIN N., “Developing and providing reliable multi-disciplinary measurement methods for graphene and related materials”, 14th edition of Graphene Week, Helsinki, Finlande, 23-27 September 2019

Ducourtieux S., DELVALLEE A., ULYSSE C., DEVRILLE COTTINI A., BERNARD G., FOUCHER J., “Implementation in France of a traceability chain for dimensional measurements at nanometre scale”, 19ème Congrès International de Métrologie, Paris France, 24-26 Septembre 2019

DEVOILLE L., LAMBENG N., FELTIN N., FAVRE G., “Characterization by SEM of the Nano fraction of additives products”, 19ème Congrès International de Métrologie, Paris France, 24-26 Septembre 2019

CROUZIER L., DELVALLEE A., DUCOURTIEUX S., DEVOILLE L., FELTIN N.,  “Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology”, 19ème Congrès International de Métrologie, Paris France, 24-26 Septembre 2019

FELTIN N., HODOROABA V-D., CROUZIER L., DELVALLEE A., DUCOURTIEUX S., PELLEGRINO F., MAURINO V., MARGUET S., TESTARD F., TACHE O., “nPSize: a project to improve the traceability chain of nanoparticle size measurements - Preliminary results of the SEM measurements”, 19ème Congrès International de Métrologie, Paris France, 24-26 Septembre 2019

SCHOPFER F., DUCOURTIEUX S., « Development of new validation services at LNE
under Graphene Flagship – Core 2 », Reunion Graphene Flagship Validation Service , Zaragoza, Espagne, 01 October 2019

CROUZIER L., DELVALLEE A., ALLARD A., DEVOILLE L., DUCOURTIEUX S., TROMAS C., FELTIN N., “Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM”, Nanoscale 2019, Braunschweig, Allemagne, 15-16 October 2019

DUCOURTIEUX S., DELVALLEE A., “LNE’s metrological AFM: a new reference for dimensional measurement at the nanoscale in Europe”, Nanoscale 2019, Braunschweig, Allemagne, 15-16 October 2019

AHAMED D., DUCOURTIEUX S., DELVALLEE A., “Minimisation of Abbe error on the LNE’s metrological AFM by alignment of interferometer laser beams using a CCD camera”, Nanoscale 2019, Braunschweig, Allemagne, 15-16 October 2019

DUCOURTIEUX S., DELVALLEE A., ULYSSE C., « Mise en œuvre en France d’une chaîne de traçabilité pour les mesures dimensionnelles à l’échelle nanométrique conduites par AFM et MEB», Workshop Zeiss - La microscopie électronique, ionique et rayons X, C2N Palaiseau, France, 24 Octobre 2019

GUILLORY J., TRUONG D., WALLERAND J-P.: “Assessment of the mechanical uncertainties of a novel and affordable multilateration system”, 3D Metrology conference, Londres, United Kingdom, 5-7 November 2019

MIMOUNE K., GUILLORY J., TRUONG D., WALLERAND J-P., GUIANVARCH C., PLIMMER M.: “Acoustic system for average temperature measurement along a short distance”, 3D Metrology Conference, , Londres, United Kingdom, 5-7 November 2019

 BOUZAKHER GHOMRASNI N., TACHE O., TESTARD F., CHIVAS-JOLY C., « dimensionnelle de nanoparticules de TiO2 par SAXS et MEB », Giens 2019, Guyancourt, France, 12-15 Novembre 2019

CHIVAS-JOLY C., BOUZAKHER GHOMRASNI N., DEVOILLE L., HOCHEPIED J. –F., FELTIN N., “Challenges in sample preparation for measuring nanoparticles size by scanning electron microscopy from suspensions, powder form and complex media”, Giens 2019. Guyancourt France, 12-15 Novembre 2019

DELVALLEE A., CROUZIER L., DUCOURTIEUX S., DEVOILLE L., TROMAS C., FELTIN N., « Développement d’une nouvelle approche hybride combinant AFM ET MEB pour la métrologie dimensionnelle des nanoparticules», GIENS 2019, Guyancourt, France, 12-15 Novembre 2019