Publications
BARTCZAK D., SIKORA A., GOENAGA-INFANTE H., ALTMANN K., ROLAND DREXEL, MEIER F., ALASONATI E., LELONG M., CADO F., CHIVAS-JOLY C., FADDA M., SACCO A., ROSSI AM., PRÖFROCK D., WIPPERMANN D., BARBERO F., FENOGLIO I., BOOTH AM., SØRENSEN L., IGARTUA A., WOUTERS C., MAST J., BARBARESI M., ROSSI F., PIERGIOVANNI M., MATTAROZZI M., CARERI M., CAEBERGS T., PIETTE A-S., PAROT J. et GIOVANNOZZI AM., "Multiparameter characterisation of a nano-polypropylene representative test material with fractionation, light scattering, high-resolution microscopy, spectroscopy, and spectrometry methods", Environmental Science: Nano, 2026, 13, 3, 1391‑1405, DOI: 10.1039/D5EN00917K.
BAU S., ARTOUS S., JACQUINOT S., LOCATELLI D., HOCHEPIED J-F., FELTIN N. et CHIVAS-JOLY C., "Impact of the polydispersion of TiO2 materials on their particle size calculated from specific surface area results obtained during an interlaboratory comparison exercise", Particuology, 2025, 98, 31‑40, DOI: 10.1016/j.partic.2025.01.002.
BENNOUNE R., CHEN G., TAGNE S-CT., VISSIERE A., DAMAK M., MEHDI-SOUZANI C., ANWER N., MAYER R. et NOUIRA H., "Advanced ultra-high precision system (NanoCyl) for accurate cylindricity measurements", CIRP Journal of Manufacturing Science and Technology, 2025, 59, 118‑126, DOI: 10.1016/j.cirpj.2025.03.005.
CHIBANE L., DELVALLÉE A., FLEURENCE N., DOURI S., MORÁN-MEZA J., ULYSSE C., PIQUEMAL F., FELTIN N. et FLAHAUT E., "Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study—Sample Preparation and Stability Issues", Nanomaterials, 2025, 15, 24, 1861, DOI: 10.3390/nano15241861.
COFREND, GAY L., LABORATOIRE NATIONAL DE MÉTROLOGIE ET D’ESSAIS (LNE), OBATON A-F., RENAULT, BLUMENFELD J-B., RENAULT et BOST P., "Use of X-ray Computed Tomography for dimensional measurement. Lessons Learned and State of the Art in 2025.", e-Journal of Nondestructive Testing, 2025, 30, 8, DOI: 10.58286/31423.
CROUZIER L., FELTIN N. et JABLON B., "A new metrology tool: using transmission Kikuchi diffraction (TKD) to identify and separate nanoparticles for regulatory purposes", Measurement Science and Technology, 2025, 36, 1, 015038, DOI: 10.1088/1361-6501/ad93ee.
DAUGBJERG TS., CROUZIER L., DELVALLÉE A., OGHEARD F., PECNIK C., ROMIEU K., SARAIVA F. et BATISTA E., "Measurement of wettability and surface roughness for metrology and quality control in microfluidics", International Journal of Metrology and Quality Engineering, 2025, 16, 2, DOI: 10.1051/ijmqe/2024021.
EWERT U., ROTH H., BURKHARD S., GUTEKUNST J., KORPELAINEN V., OBATON A-F., NEUSCHAEFER-RUBE U., BLUMENSATH T. et KATIC M., "New Concept for Detail Sensitivity Monitoring in industrial Computed Tomography - the EURAMET Project SensMonCT", e-Journal of Nondestructive Testing, 2025, 30, 8, DOI: 10.58286/31446.
FELTIN N., "Matériaux de référence pour la nanométrologie - État des lieux", Mesures mécaniques et dimensionnelles, 2025, DOI: 10.51257/a-v1-r6743.
FERRUCCI M., OBATON A-F., CERDA R., AU B., RODRIGUEZ N., AMMAR Z., BALENSIEFER G., DIVIN C., LENHARDT J. et GIERA B., "Measuring thermal curing induced shrinkage of material extrusion based additive manufacturing silicone elastomer lattices by X-ray computed tomography", Tomography of Materials and Structures, 2025, 8, 100064, DOI: 10.1016/j.tmater.2025.100064.
GUILLORY J., BASELGA S., WALLERAND J-P., TRUONG D., GARCÍA-ASENJO L., LUJÁN R., PESCE D., WEYER B., FUCHS J-F. et MISSIAEN D., "Comparison between a Two-Wavelength Absolute Distance Meter and a GNSS-Based Distance Meter at CERN Geodetic Network", Journal of Surveying Engineering, 2025, 151, 1, 04024014, DOI: 10.1061/JSUED2.SUENG-1523.
GUILLORY J., TRUONG D. et WALLERAND J-P., "Comparison of air refractive index formulae when used in telemetry for two-wavelength refractivity compensation", Metrologia, 2025, 62, 4, 045003, DOI: 10.1088/1681-7575/ade9c5.
GUILLORY J., WALLERAND J-P., TRUONG D., SARGEANT B., RICHARDS C., ROBSON S., GARCÍA BERDOTE A., PUERTO P., HERVÉ P-E. et GOUTTEFARDE M., "Positioning of a cable-driven parallel robot at better than 250 μm using multilateration and photogrammetric measurement systems", Precision Engineering, 2026, 97, 1087‑1108, DOI: 10.1016/j.precisioneng.2025.11.020.
KAAL J., FELTIN N., LELONG M., YIN H., GLIDLE A., ROMIEU K. et BATISTA E., "Comparison of Measurement Protocols for Internal Channels of Transparent Microfluidic Devices", Metrology, 2025, 5, 1, 4, DOI: 10.3390/metrology5010004.
LAFON L-F., VISSIÈRE A., MEHDI-SOUZANI C., ANWER N. et NOUIRA H., "Reference data generation for evaluating pairwise registration algorithms", Measurement, 2026, 257, 118602, DOI: 10.1016/j.measurement.2025.118602.
LONGUET C., CHIVAS-JOLY C., LAMBENG N., FOREST V., LECLERC L., SARRY G., POURCHEZ J. et LOPEZ-CUESTA J-M., "New insights on physicochemical features and toxicological outcome provided from incineration of nanocomposites", Next Nanotechnology, 2025, 7, 100113, DOI: 10.1016/j.nxnano.2024.100113.
OBATON A-F., "Fabrication additive : contrôles", Techniques de l’Ingénieur, 2025.
OBATON A-F., EWERT U., ROTH H., WILBIG J., BROUCZEK D., SCHWENTENWEIN M., BURKHARD S., KÜNG A., REMACHA C., COCHENNEC N., GAY L. et KATIC M., "Determination of the Image Quality in Computed Tomography and its Standardisation", Journal of Nondestructive Evaluation, 2025, 44, 4, 128, DOI: 10.1007/s10921-025-01266-x.
PIQUEMAL F., CHRÉTIEN P., MORÁN‐MEZA J., HOUZÉ F., DELVALLÉE A., ULYSSE C. et HAROURI A., "Calibrating Resistance and Current Measurements in Conductive Probe Atomic Force Microscopy: New Reference Samples and Calibration Methods", physica status solidi (a), 2025, 222, 14, 2400711, DOI: 10.1002/pssa.202400711.
PUTZU M., WIESNER Y., WEIMANN C., HODOROABA V-D., MUNIATEGUI LORENZO S., FERNÁNDEZ-GONZÁLES V., BOOTH AM., IGARTUA A., BENISMAIL N., COÏC L., CHIVAS-JOLY C., FENOGLIO I., ROSSI AM., GIOVANNOZZI AM. et ALTMANN K., "Optimization of tablet processing as a reference material for microplastic detection methods", Analytical and Bioanalytical Chemistry, 2026, 418, 4, 1001‑1014, DOI: 10.1007/s00216-025-06271-7.
WILBIG J., WILSON-HEID AE., BERNARD L., BAPTISTA J. et OBATON A-F., "Comparison of Porosity Analysis Based on X-Ray Computed Tomography on Metal Parts Produced by Additive Manufacturing", Applied Sciences, 2025, 15, 18, 9876, DOI: 10.3390/app15189876.
Communications
BEAUDOUX F. et BLANC B., "The dissemination of the mass unit in France…towards the end of standards?", CIM 2025, Lyon (France), mars 2025.
BLANC B. et BEAUDOUX F., "Gravimetric standard leak artefact calibration", CIM 2025, Lyon (France), mars 2025.
ROSSI AM., ALTMANN K., WIESNER Y., FADDA M., PUZU M., SACCO A., MUNIATEGUI LORENZO S., BENISMAIL N., ALASONATI E., CHIVAS-JOLY C., BOOTH AM. et GIOVANNOZZI AM., "Lactose Tablets as Suitable Microplastics Reference Material to Support Validation Studies and Quality Control", BERM16 - International Symposium on biological and Environmental reference Materials, Halifax (Canada), juin 2025.
CHIBANE L., DELVALLÉE A., FELTIN N. et FLAHAUT E., "Correlative metrology for the study of the physico-chemical properties of graphene oxide during its reduction", Nanoscientific Forum Europe 2025, Orsay (France), septembre 2025.
CHIBANE L., DELVALLÉE A., FLEURENCE N., MORÁN J., DAVÉE G., DOURI S., FELTIN N. et FLAHAUT E., "Correlative metrology approach for the characterization at nanoscale", Nanoscientific Forum Europe 2025, Orsay (France), septembre 2025.
RIBOTTA L. et DELVALLÉE A., "Traceable characterisation of AFM probes: new ways to reconstruct tip shape and calibrate cantilevers", NanoInnovation, Rome (Italie), septembre 2025.
FLEURENCE N., DOURI S., DELVALLÉE A., CHIBANE L. et FELTIN N., "Thermal characterization at the micro- and nanoscale", NANOscientific Forum Europe, Orsay (France), 17 septembre 2025.
FLEURENCE N., DOURI S., GOMÈS S., DELVALLÉE A., HAMEURY J. et FELTIN N., "Study of self-heated resistive probe wear in scanning thermal microscopy", Tempmeko ISHM 2025, Reims (France), 20 octobre 2025.
DARTEVELLE C., NOVIANT S., PLIMMER M., SILVESTRI Z. et VISSIÈRE A., "Optical force, balance for AFM cantilever stiffness calibration using passive magnetic levitation", MacroScale 2025, Buenos-Aires (Argentine), novembre 2025.
DOURI S., FLEURENCE N., GOMÈS S., DELVALLÉE A. et HAMEURY J., "Study Of Self-Heated Resistive Probe Wear In Scanning Thermal Microscopy", Journées Plénières GDR NAME 2025, Palaiseau (France), 12 novembre 2025.
ZEESHAN HABIB R., LOPEZ-CUESTA J-M., POURCHEZ J., LECLERC L., MOUSSARD C., CHIVAS-JOLY C. et LONGUET C., "Impact of polymer recycling at lab-scale on nano-microparticles emissions in atmosphere", GDR naMasté, Grenoble (France), 9 décembre 2025.