Publications
AGAZAR M., DELLE FEMINE A., GALLO D., IODICE C. and LUISO M., “Parallel-connected voltage generators for the characterization of MV VTs up to 150 kHz”, Proceedings 2025 of the IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS), Bucharest, Romania, 24-26 Sept. 2025, IEEE Xplore, DOI: 10.1109/AMPS66841.2025.11219932.
AGAZAR M., ELG A.-P., RAMIREZ A., IODICE C., GIODANO D., HÄLLSTRÖM J, ROVIRA J., LUISO M., LETIZIA P.S. and NIEMINEN T., “Towards a traceable calibration of medium voltage instrument transformers up to 150 kHz”, Proceedings of the 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025, EPJ Web of Conferences, 2025, 323, Electromagnetism, 12007, DOI: 10.1051/epjconf/202532312007.
AGAZAR M., IODICE C. and LUISO M., “Reference high-voltage sensing chain for the assessment of Class 0.1-WB3 instrument transformers in the frequency range up to 150 kHz according to IEC 61869”, Sensors, 2025, 25, 20, 6416, 10.3390/s25206416.
AGAZAR M., SAADEDDINE H., DOUGDAG K., OUAMEUR M. and AZZOUG M., “The design and development of a low-cost and environmentally friendly voltage divider for on-site high-voltage calibration up to 850 kV”, Sensors, 2025, 25, 13, 3964, DOI: 10.3390/s25133964.
ASLAN H., KAJA K., MORAN-MEZA J., PIQUEMAL F. and ALVAREZ J., CHAUVIN N., PENUELAS J., SONDERSKOV S.M. and REGRENY P., “Atomic force microscopy as a multimetrological platform for energy devices”, Nanoscale, 2025, 17 14, 8642-8650, DOI: 10.1039/D4NR05107F.
BA D. and LERAT J.-M., “New structure for high-sensitivity coaxial thermal power sensor in the frequency range from DC to 50 GHz”, Proceedings of the 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025, EPJ Web of Conferences, 2025, 323, Electromagnetism, 12005, DOI: 10.1051/epjconf/202532312005.
BECHER F., ZIADÉ F., BA D. and LE BIHAN Y., “Toward a D-band thermoelectric power sensor”, Microwave and Optical Technology Letters, 2025, 67, 1, e70095, DOI: 10.1002/mop.70095.
BEN-HASSIN S. and LERAT J.-M., “Electric field probe calibration method by using a TEM cell for reference field generation”, Proceedings of the 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025, EPJ Web of Conferences, 2025, 323, Electromagnetism, 12001, DOI: 10.1051/epjconf/202532312001.
BEN-HASSINE S., LERAT J.-M., DUBARD J., BETIS P. and RENOUX D., “Calibration of target-tracking MIMO radar sensors by comparison with a narrow-beam CW doppler reference”, Metrology, 2025, 5, 1, 14, DOI: 10.3390/metrology5010014.
DAABOUL Y., ISTRATE D., LE BIHAN Y., BERTIN L. and YANG X., “Exploring DC power quality measurement and characterization techniques”, Sensors, 2025, 25, 19, DOI: 10.3390/s25196043.
DJORDJEVIC S., BEHR R. and POIRIER W., “A primary quantum current standard based on the Josephson and the quantum Hall effects”, Nature Communications, 2025, 16, 1447, DOI: 10.1038/s41467-025-56413-9.
GUILLEMOT V. and POIRIER W., “Nonmonotonic radiative heat transfer in the transition from far field to near field”, Physical Review Letters, 2025, 134, 193801, DOI: 10.1103/PhysRevLett.134.193801.
HADDADI K., LENOIR C., SEBBACHE M., MORAN-MEZA J. and PIQUEMAL F., “Demonstration of scanning near- field microwave microscopy of sub-fF vertical MOS capacitors using six-port interferometry”, Proceedings of 2025 IEEE MTT-S Latin America Microwave Conference (LAMC-2025), San Juan, Puerto Rico, USA, 22-24 January 2025, IEEE Xplore 128-131, DOI: 10.1109/LAMC63321.2025.10880556.
HÜLAGÜ D., ERMILOVA E., WEISE M., de PREVILLE S., HOFFMANN J., MORAN-MEZA J., PIQUEMAL F. and HERTWIG A., “Multimethod electrical characterization of thin indium tin oxide films: structuring and calibration sample development for scanning probe microscopy”, Physica Status Solidi (A) Applications and Materials Science, 2025, 222, Special Issue: ALTECH 2024, 2400871, DOI: 10.1002/pssa.202400871.
KISHIKAWA R., HORIBE M., RÜFENACHT J., HOWES J. STOKES D., YUEYAN S., YUSONG M., SAKARYA H., DRESSLER E., MAGAGULA L., MICHAUD A., KONYSHEV A., DRAZIL K., USYDUS L., BERTO L., JUDASCHKE R., STENARSON J., MUBARAK F.A. and ALLAL D., “CCEM key comparison CCEM.RF-K5c.CL - Scattering coefficients by broad-band methods 0.1 GHz – 33 GHz, 3.5 mm connector”, Metrologia, 2025, 62, 1A (Suppl.), 01004, DOI: 10.1088/0026-1394/62/1A/01004.
KLUSS J., HALLSTROM J.K., HAVUNEN J., YAN W., HLAVACEK J., CROTTI G., AGUADO T., VASCONCELLOS R., LIU N., MEISNER J., MEREV A., ZEIER M., BERGINC M., SADKOWSKI and HADJADJ Y., “RMO supplementary comparison EURAMET.EM-S36 Final report - Comparison of partial discharge (PD) calibrators from 0.1 pC to 10 nC”, Metrologia, 2025, 62, 1A, 01002, DOI: 10.1088/0026-1394/62/1A/01002.
KOTBI A., LEJEUNE M., OUGHADDOU H, RAJPUT N., ZHANG X., BELHADJ J., ZAKARIA Y., RICHERT D., PIQUEMAL F., MORAN-MEZA J., EL MARSSI M. and JOUIAD M., “Eco-friendly deposition of catalyst-free graphene on diverse substrates”, Advanced Sustainable Systems, 2025, 9, 2, 2500105, DOI: 10.1002/adsu.202500105.
KRRAOUI H. and LERAT J.-M., “Traceability of the WBCO standard attenuator by comparing with an inductive voltage dividers”, Proceedings of the 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025, EPJ Web of Conferences, 2025, 323, Electromagnetism, 12002, DOI: 10.1051/epjconf/202532312002.
LUO Y., SHANG X., AUSDEN L., RIDLER N., ALLAL D. and WOJCIECHOWSKI M., “Statistical analysis on interlaboratory comparison case study of dielectric measurements”, Proceedings 2025 of the 55th European Microwave Conference (EuMC), Utrecht, Netherlands, 23-25 Sept. 2025, IEEE Xplore, DOI: 10.23919/EuMC65286.2025.11235167.
MUBARAK F.A., PHUNG G.N., ARZ U, HADDADI K., ROCH-JEUNE I., DUCOURNAU G., FLISGEN T., DOERNER R., ALLAL D., JAYASANKAR D., STAKE J., SCHMIDT R., FISHER G., RIDLER N.M. and SHANG X., “An interlaboratory comparison of on-wafer S-parameter measurements up to 1.1 THz”, IEEE Transactions on terahertz science and technology, 2025, 15, 3, DOI: 10.1109/TTHZ.2025.3537461.
OUAMEUR M. and PATOIS E., “Calibration of inductance using a PXI-based Maxwell-Wien bridge from 20 Hz to 20 kHz”, Metrology, 2025, 5, 2, 29, DOI: 10.3390/metrology5020029.
PIQUEMAL F., CHRÉTIEN P., MORAN-MEZA J., HOUZÉ F., DELVALLÉE A., ULYSSE C. and HAROURI A., “Calibrating resistance and current measurements in conductive probe atomic force microscopy: New reference samples and calibration methods”, Physica Status Solidi (A) Applications and Materials Science, 2025, 222, Special Issue: ALTECH 2024, 2400711, 10.1002/pssa.202400711.
POIRIER W. and DJORDJEVIC S., “A universal quantum electrical standard is getting closer”, Nature Electronics, 2025, 8, 8, 632-634, DOI: 10.1038/s41928-025-01442-x.
RICHERT D., DELERUYELLE D., MORAN-MEZA J., KAJA K., IMANALIEV A., HOFFMANN J., GAUTIER B. and PIQUEMAL F., “A numerical analysis of the short open load calibration robustness for capacitance measurements in scanning microwave microscopy”, Measurement Science and Technology, 2025, 36, 1, 015013, DOI: 10.1088/1361-6501/ad7e3b, published: 18 Oct. 2024.
SECK D., ALLAL D., MARLEC F., LENOIR C., SEBBACHE M. and HADDADI K., “Nanoscale calibration standards for on-wafer S-parameters measurements up to 110 GHz”, Proceedings of the 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025, EPJ Web of Conferences, 2025, 323, Electromagnetism, 12003, DOI: 10.1051/epjconf/202532312003.
SECK D., MARLEC F., LENOIR C., SEBBACHE M., ALLAL D. and HADDADI K., “Experimental study on the repeatability of nanoscale on-wafer calibration structures on high resistivity silicon substrate up to 110 GHz”, Proceedings 2025 of the 55th European Microwave Conference (EuMC), Utrecht, Netherlands, 23-25 Sept. 2025, IEEE Xplore 588-591, DOI: 10.23919/EuMC65286.2025.11235077.
ZUCCA M., AL-ZUBAIDI-R-SMITH. N., BARTOVA L., van den BROM H., CALLEGARO L., CULTRERA A., FAST L., GIRIMONTE A., HASSANZADEH M., MARISCOTTI A., MASOURAS A., MEDVED J., MUSUMECI S., NICAOL G., OUAMEUR M. and RIETVELD G., “MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors”, Measurement: Sensors, 2025, 38, Suppl., 101434, DOI: 10.1016/j.measen.2024.101434.
Communications
AGAZAR M., “Towards a traceable calibration of medium voltage instrument transformers up to 150 kHz”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
BA D. and LERAT J.-M., “New structure for high-sensitivity coaxial thermal power sensor in the frequency range from DC to 50 GHz”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
BEN HASSINE S., “Electric field probe calibration method by using a TEM cell for reference field generation”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
COUEDO F., “Molecular doping of epitaxial graphene on SiC for the quantum Hall resistance standard at low magnetic field”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
KRRAOUI H., “Traceability of the WBCO standard attenuator by comparing with an inductive voltage dividers”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
MORAN-MEZA J., “Development of reference samples for calibrating resistance and current measurements in Conductive probe Atomic Force Microscopy”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
SAADEDDINE H., “Modeling of high voltage sections to design a reference universal voltage divider at LNE”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
SECK D., “Nanoscale calibration standards for on-wafer S-parameters measurements up to 110 GHz”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
SECK D., ALLAL D. and HADDADI K., “Design of S-parameter standards for high-frequency nano-devices characterization”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
TAUPIN M., “Operation of the quantum Hall resistance standard in a closed-cycle cryogen-free cryostat at LNE”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
THEVENOT O., “Direct traceability of the impedance units to the quantum Hall effect: The new project « ImpACQ » at LNE”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
YAHYAOUI H., OUAMEUR M. and LAGONOTTE P., “An overview of the different sources of uncertainty affecting the measurement of electro chemical elements”, 22nd International Metrology Congress (CIM2025), Lyon, France, 11-14 March 2025.
CHRÉTIEN P., PIQUEMAL F., HOUZÉ F., MORÁN-MEZA J., ULYSSE C. and HAROURI A., “Development of measuring protocols and data processing methods for reference samples designed to calibrate electrical measurements at nanoscale”, C'nano 2025, Cité des Sciences et de l'Industrie, Paris, France, 18-21 mars 2025.
MORÁN-MEZA J., PENUELAS J., RÉGRENY P. and PIQUEMAL F., “Calibrated measurements of dopant concentration on vertical nanowires by scanning microwave microscopy”, C'nano 2025, Cité des Sciences et de l'Industrie, Paris, France, 18-21 mars 2025.
PIQUEMAL F., “ELENA project – electrical nanoscale metrology in industry: Review of the main results”, C'nano 2025, Cité des Sciences et de l'Industrie de La Villette, Paris, France, 18-20 mars 2025.
TAUPIN M. and COUËDO F., “High-precision electrical measurements compatibility in a cryogen-free cryostat”, Séminaire CRYONEXT, Paris Centre Bercy, France, 19 mars 2025.
SECK D., MARLEC F., ALLAL D., HADDADI K., « Structures d’étalonnage vectoriel à l’échelle nanométrique », 18ᵉ édition des Journées de Caractérisation Micro-ondes et Matériaux (JCMM-2025), Saint- Etienne, France, 24-26 mars 2025.
CHRETIEN P., PIQUEMAL F., HOUZE F., MORAN-MEZA F., ULYSSE C. et HAROURI A., « Mise au point de protocoles expérimentaux et de méthodes d’analyse des données pour les échantillons de référence destinés à étalonner les mesures électriques à l'échelle nanométrique », 26e Forum des Microscopies à Sondes Locales, Spa, Belgique, 31 mars - 4 avril 2025.
LAHBACHA K., MAFFUCCI A., DI CAPUA G., MIELE G., CHIARIELLO A.G., PHAM T.D. and ALLAL D., “Signal integrity analysis and measurement of thin film microstrip lines (TFMSLs)”, 29th IEEE Workshop on Signal and Power Integrity (IEEE SPI 2025), Gaeta, Italy, 11-14 mai 2025.
DJORDJEVIC S., BEHR R. and POIRIER W., “Towards a single and versatile experiment based on the PQCG for the realization of the electrical units”, DCQM SC meeting of EURAMET TC-EM, 10-12 juin 2025.
BA D. and LITWIN A., “Novel thermopile design for waveguide and coaxial microcalorimeters in the frequency range from DC to 40 GHz”, Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
ELMAZRIA O. et ALLAL D., « Mesures haute fréquence, outils et méthodes de calibrage », Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
ERARD L., PIQUEMAL F., ALLAL D. et ACHKAR J., « L’évolution des unités SI utilisées en radioélectricité », Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
LENOIR C., SEBBACHE M., SECK D., ALLAL D. and HADDADI K., “AI-enhanced nano-robotic wafer measurement station: automation, precision, and performance evaluation”, Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
MORAN-MEZA J., “Calibrated measurements of dopant concentration on vertical nanowires by scanning microwave microscopy”, Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
MORAN-MEZA J., PENUELAS J., CHAUVIN N., REGRENY P. et PIQUEMAL F., « Mesures étalonnées de la concentration en dopants sur nanofils verticaux par microscopie à sonde locale micro-onde », Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
SECK D., MORAN-MEZA J., MARLEC F., LENOIR C., SEBBACHE M., ALLAL D. and HADDADI K., “On-wafer calibration for nanodevice characterization up to 110 GHz”, Journées scientifiques d’URSI-France, Sorbonne Université, Paris, France, 10-12 juin 2025.
LUO Y., SHANG X., AUSDEN L., RIDLE N. R and ALLA D. L, “Statistical analysis on interlaboratory comparison case study of dielectric measurements”, 55th European Microwave Conference (EuMC), Utrecht, Netherlands, 23-25 Sept. 2025.
SECK D., MARLEC F., LENOIR C., SEBBACHE M., ALLAL D. and HADDADI K., “Experimental study on the repeatability of nanoscale on-wafer calibration structures on high resistivity silicon substrate up to 110 GHz”, 55th European Microwave Conference (EuMC), Utrecht, Netherlands, 23-25 Sept. 2025.
AGAZAR M., IODICE C., DELLE FEMINE A., LUISO M. and GALLO D., “Parallel-connected voltage generators for the characterization of MV VTs up to 150 kHz”, 15th IEEE International Workshop on Applied Measurements for Power System (AMPS 2025), Bucharest, Romania, 24-26 Sept. 2025.
MORAN-MEZA J., “Calibrated measurements of dopant concentration on vertical nanowires by scanning microwave microscopy”, Workshop on characterization and instrumentation of nano-objects, Institut Jean Lamour, Nancy, France, 6 novembre 2025.
MORAN-MEZA J., “Development of reference samples for calibrating resistance and current measurements in conductive atomic force microscopy”, Journées Plénières du GDR NAME, C2N, Palaiseau, France, 12-14 novembre 2025.
MORAN-MEZA J., “Projet JRP ELENA (Electrical nanoscale metrology in industry)”, 2e édition des Rencontres du Centre de Nanosciences et de Nanotechnologies, C2N, Palaiseau, France, 4 décembre 2025.